Introduction
            ■ Scanning Electron Microscope (Zeiss Supra-25 SEM)
                –  History
                –  Instrumentation
                –  Theory
            ■ Samples 
                –  Results & Different Uses
                    ■ Image Capture
                    ■ Elemental Analysis
                    ■ Elemental Mapping
            Image: http://www.physics.montana.edu/ical/instrumentation/fesem.html
            SEM: Brief History
            ■ History
                –  First SEM was built by Manfred von Ardenne in Germany in 1937
                –  First SEM sold commercially 1965 (Cambridge Scientific Instrument Co.)
                –  First SEM in Iceland 1988 (NMI)
                –  The one we used: 2004
              Image: https://www.vonardenne.biz/en/company/manfred-von-
              ardenne/
       Instrumentation
         Electron Gun
         Sample Stage
           Samples under high vacuum
         Camera & Detectors
           Focus the Sample
           X-ray detector
       Image: http://nau.edu/cefns/labs/electron-microprobe/glg-510-class-
       notes/instrumentation/
                 Instrumentation: Interaction Volume
                  
                 •  Depth & Width of the Interaction 
                    Volume
                  
                 •  B
                  
                 •  Distance the electron penetrates the 
                    sample
                 •   r
                 Image: http://nau.edu/cefns/labs/electron-microprobe/glg-510-class-
                 notes/instrumentation/
      Samples
      ■ MUST be conductive
      ■ Preferably flat & non-porous
      ■ Powders, etc. prepared in a conductive Bakelite casting & polished
      ■ If not conducting, must be coated with gold (imaging only)
      ■ Cannot use liquids