142x Filetype PPTX File size 1.16 MB Source: notendur.hi.is
Introduction ■ Scanning Electron Microscope (Zeiss Supra-25 SEM) – History – Instrumentation – Theory ■ Samples – Results & Different Uses ■ Image Capture ■ Elemental Analysis ■ Elemental Mapping Image: http://www.physics.montana.edu/ical/instrumentation/fesem.html SEM: Brief History ■ History – First SEM was built by Manfred von Ardenne in Germany in 1937 – First SEM sold commercially 1965 (Cambridge Scientific Instrument Co.) – First SEM in Iceland 1988 (NMI) – The one we used: 2004 Image: https://www.vonardenne.biz/en/company/manfred-von- ardenne/ Instrumentation Electron Gun Sample Stage Samples under high vacuum Camera & Detectors Focus the Sample X-ray detector Image: http://nau.edu/cefns/labs/electron-microprobe/glg-510-class- notes/instrumentation/ Instrumentation: Interaction Volume • Depth & Width of the Interaction Volume • B • Distance the electron penetrates the sample • r Image: http://nau.edu/cefns/labs/electron-microprobe/glg-510-class- notes/instrumentation/ Samples ■ MUST be conductive ■ Preferably flat & non-porous ■ Powders, etc. prepared in a conductive Bakelite casting & polished ■ If not conducting, must be coated with gold (imaging only) ■ Cannot use liquids
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