QUICK GUIDE
            ICP-MS – High Resolution ICP Mass Spectrometry
                                                                                                                                            Thermo Scientific Products:
                                                                                                                                            – ELEMENT 2
                                                                                                                                            – ELEMENT XR
         IN BRIEF…
               • Quantitative multi-element analysis across the periodic table (Li to U)                                                    – XSERIES 2
               • Detection limits < 1 ppt in solution for most elements                                                                     – ELEMENT GD
               • Detection limits of 0.005 ppq possible with Jet interface                                                                  – NEPTUNE PLUS
               • Sector field technology (SF) for highest sensitivity and selectivity for interference removal
               • Wide range of sample introduction systems; uptake rates 20 to 1000 µL/min with 
                 Quartz or PFA inlet systems, optional Peltier cooling and aerosol desolvation
               • Coupling to laser ablation and LC and GC systems
                                                                                        Basic Theory
                                                                                        In ICP-MS a sample aerosol is transported
                                                                                        into an argon inductively coupled plasma
                                                                                        (ICP) ion source where it is quickly and
                                                                                        efficiently desolvated, atomized and ion-
            Applications                                                                ized. The resulting ions from the ICP are
            Sector-field ICP-MS is used for trace and ultra trace metal                 extracted through a series of cones into
            analysis due to its high sensitivity. The second major benefit is           the mass spectrometer (MS). The source
            its capability to remove spectral interferences by high mass                and interface are kept at ground potential
            resolution to achieve the highest accuracy possible. The range              for easy coupling of peripherals like
            of applications areas that SF-ICP-MS is used in is mostly                   HPLC, CE, GC and laser ablation. 
            semiconductor grade chemicals, industrial research and                           High resolution ICP-MS uses a combination of
            development, as well as highly accurate geochemical analyses,               magnetic and electrical sector fields for separating
            for example:                                                                trace analytes from interferences. Transfer optics focus
                                                                                        the ions on the entrance slit of the analyzer. The user
                 • Ultratrace metal analysis in high purity acids and waters            selectable slit width defines the mass resolution.
                 • High-accuracy trace metal determination in                           Resolution settings of 300 to 10000 are typically
                 geochemical applications                                               applied for the ultimate flexibility in analysis.
                 • High-precision isotope ratios                                             The detection system can deliver a linear response over 12 orders of 
                 • Actinide analysis for environmental radiation control                magnitude enabling calibration ranges from sub-ppq to high ppm concentrations 
                 • Laser ablation                                                       in any sample analyzed.
                 • Speciation analysis by LC-MS or GC-MS coupling                         Resolution =                             Mass of analyte
                                                                                                          Mass difference between interference and analyte peak
                                                                                                                                     R =    m
                                                                                                                                          Δ m 
                                                                                        Technology
                                                                                        • Quantitative multi-element analysis across the entire periodic table
                                                                                        • High transmission and low background noise ensure the highest detection power
                                                                                          of any ICP-MS with sub-ppq detection limits achievable
                                                                                        • Maximum level of selectivity and accuracy from the use of high mass resolution
                                                                                        • High scan speed for transient signals from e.g. laser ablation, LC, or GC
                                                                                        • Determination of ultra-traces and major elements within a single scan, due to a
                                                                                          fully automatic detector with > 12 orders of linear dynamic range
                                                                                        • Easy coupling to peripherals due to grounded interface
                                                                                        • Flat top peaks with and without interference removal for improved isotope 
                                                                                          ratio precision
         For more information go to www.thermoscientific.com/MaterialsScience
         OV52152_E 05/11M     ©2011 Thermo Fisher Scientific Inc. All rights reserved.